Apparatus for indicating departure from predetermined limits

ABSTRACT

Testing apparatus which converts an electrical analog signal to digital form and then by the application of digital logic indicates and records departure from predetermined limits is disclosed. The apparatus also records in decimal form identification of the test composition specification limits and actual values at each test point over a selected testing range, over which range a parameter varies with time, and the value of the parameter is received in the form of an electrical analog signal.

United States ate Bibby et a1. Apr. 10, 1973 54] APPARATUS FORINDICATDJG 3,068,450 12/1962 Fletcher et a1. ..340/149 DEPARTURE FROMPREDETERL'IINED 3,090,223 /1963 Juffa et a1 ..73/59 S 3,120,652 2/1964Weighton et a1. .340/147 3,182,494 5/1965 Beatty et a1. ..73/101Inventors: Malcolm y; Ralelgh 3,217,306 11/1965 ....340/1s1 Wise, bothof Akron, Ohio 3,246,249 4/1966 Boscia ....328/146 3,267,364 8/1966 Pageet a1. ..324/30 [73] Mmsam 3,320,618 5 1967 Kuch et a1. ..346 35 [22]Fil d: A 28, 1969 3,336,478 8/1967 Franklin .250/83.3 3,439,534 4/1969Pilgrim ..73/117 [21] Appl. No.: 819,732

Primary Examiner-Jerry W. Myracle [52] US. Cl ..73/101, 73/156 y gRothwell, Mion, Zirm and a [51] 1111.0. ..G0ln /00 peak, Richard Terbe,E. Maurer and [58] Field of Search ..'....328/l46, 147; BI'USOK 340/172,213,149 R, 181; 73/1 17, 59,101, 60, 15.6; 346/35, 34; 324/ R; 235/150 wABSTRACT I Testing apparatus which converts an electrical analog [56]References Cited signal to digital form and then by the application ofUNITED STATES PATENTS digital logic indicates and records departure frompredetermined limits is disclosed. The apparatus also 3 records indecimal form identification of the test com- 3553444 H1971 2: ct I151position specification limits and actual values at each 3:555:258 1,1971i "BS/1'81 test point over a selected testing range, over which3,568,143 3 1971 Naquin ..340/155 range a Parameter varies with time.and the value Of 3,581,558 6/1971 Porter et a1... ..73/ 101 theparameter is received in the form of an electrical 2,901,739 8/1959Freitas 340/213 analog signal. 2,905,520 9/1959 Anderson..... ....346/343,053,079 9/1962 Miller et a1. ..73/60 13 Claims, 5 Drawing Figures s l1 TIME CARD 29 coup/111110 READER MULTIPLEXER 2| N 11 15 RHEOMETER INPUT22 ANALOGUE Z7 34 OUTPUT 3 TORQUE 20 INTERFACE l 5? 1 COMP/111111011SERIALIZER INTERFACE 81 DA TRANSDUCER 111111 CONVERTER mr RECORDERTIMING DISH/1L AND CLOCK CONTROL LOGIC APPARATUS FOR INDICATINGDEPARTURE FROM PREDETERMINED LIMITS BACKGROUND OF THE INVENTION 1. Fieldof the Invention The invention pertains to the art of measuring andrecording by electrical means. It pertains to improvements in testingdevices which measure a parameter which varies with time andparticularly pertains to improvements, accessories or auxiliaryequipment for devices which sense mechanical stress of plastic and othersolid deformable substances by a DC electrical analog signal. Typical ofsuch testing devices are curemeters.

2. Description of the Prior Art Several methods are available formeasuring and recording the stress signal obtained from testinginstruments, such as the Oscillating Disk Rheometer disclosed in thecopending U.S. patent application of George E. Decker, Ser. No. 282,527,filed May 6, 1963, or the instruments disclosed in Peters U.S. Pat. No.3,039,297, CI. 73-88, assigned to Bayer (1962), or J. R. Beattys U.S.Pat. No. 3,182,494, Cl. 73-101, as-' signed to the B. F. GoodrichCompany (1965). Sensing the shearing forces on solid deformablesubstances subjected to the shearing action of an oscillating drivemechanism at predetermined strain over a predetermined time fraction ofthe strain cycle and converting the AC signal to a steady DC signalsuitable for recording is described in U.S. patent application Ser. No.634,257 to R. W. Wise, filed Apr. 27, 1967. In most of the aforesaidcuremeters, torque is sensed by suitable strain gauges. At present, thecondition of the curing rubber is monitored continuously (on chartrecorders) and the cure curve is visually examined on completion ofthecuring process to ascertain whether or not predeterminedspecifications have been violated.

SUMMARY OF THE INVENTION It is, therefore, an object of the presentinvention to provide a programmed system which automatically tests forspecification violation at predetermined points prior to completion ofthe curing process, thereby eliminating the chart recorder presentlyused in production control of rubber product manufacturing.

Another object is to indicate departure from predetermined limits and torecord limits and actual values at each test point over a selectedtesting range over which a parameter varies with time.

A further object is to provide a system which samples at predeterminedtimes a DC analog signal of torque from the strain gauge of a curemeter,compares torque to the specification limits, records the values andlimits and indicates when an actual value is out of specification.

According to the present invention, the foregoing and other objects areattained by providing a process by which departure from predeterminedlimits is indicated at each test point over selected testing rangeinvolving a parameter which varies with time indicated by an electricalanalog signal which comprises converting the analog signal to a digitalsignal, coding the test composition and specification limits of time orof the parameter which varies with time in digital form at predeterminedtest points, either measuring the parameter at predetermined discretetimes or measuring the time to reach a predetermined value of theparameter, comparing the test value with the specification limits andrecording the limits and actual test value in decimal form. Theapparatus according to the invention comprises, in combination, a codedrecord of the test composition, specification limits at predeterminedtest points, timing means and means cooperating therewith either formeasuring the parameter at the predetermined times or measuring the timeto reach a predetermined test value of the parameter, means forconverting the analog signal to a digital signal, means for comparingthe test value to specification values, means for indicating that thetest value is outside limits, means for recording serially the limitsand actual test value in decimal form. Preferably there is also providedmeans for recording that the test value is outside limits. The recordingmay provide in addition, if desired, a coded version of the informationsuitable for feeding to a computer. The aforesaid addition is convenientif statistical study of production control data is desired. Theinvention provides data acquisition and automated decision making whenused with a curemeter by providing apparatus which indicates and recordsspecification limits and actual values over a selected testing range.

BRIEF DESCRIPTION OF THE DRAWINGS The specific nature of the invention,as well as other objects, aspects, uses and advantages thereof willclearly appear from the following description and from the accompanyingdrawings, in which:

FIG. 1 is a typical cure curve obtained with a rheometer withspecification limits marked out at four different times.

FIG. 2 is a block diagram of a simplified embodiment of the invention.

FIG. 3 is a cure curve showing examples of two gates, that is, torqueand time.

FIG. 4 is a cure curve illustrating use of two torque gates as a timegate.

FIG. 5 is a block diagram of a preferred embodiment of the invention.

DESCRIPTION OF THE PREFERRED EMBODIMENTS The specification limits andpredetermined test times are preferably punched into a standard IBMcolumn card in binary coded decimal, BCD, code, (a widely used BCD codeemploys the numbers 1, 2, 4 and 8 only to form the decimal numbers 1-9thus 7 1+2+4, etc.) The BCD code is preferred due to its compatibilitywith the digital logic employed throughout the system. Furthermore,coding is simplified by a decimal code. In the decimal system, a simplecode is assigned to each digit of the number to be coded. The particularBCD code is merely a matter of choice. The 4,4,2,1 system, also widelyused, is suitable. In a straight binary code, a unique code designationapplies to the whole number and can be used if desired, but is lessconvenient due to more complicated calculations required for coding. Thelimits and times of FIG. 1 are punched into the card, six columns ofwhich are available for compound identification and are printed at theinitiation of the test. The print-out capability of this invention is aresult of the use of digital circuitry. Analog systems could not havethis capability.

I In the simplified embodiment of the invention illustrated in FIG. 2designed for use with an oscillating disk curemeter, the actual torquevalues are measured at discrete predetermined times and compared tospecification limits. It is convenient to employ an input interface unit1 which contains the power source for exciting the strain gauge used tosense viscosity in a curemeter. The strain gauge connections providepower to the torque transducer 2 via line 20, while the analog torquesignal is supplied via line 21 to the input interface from whence theanalog torque signal continues via line 22. Versatility is therebyachieved because a different interface unit can be substituted where therequirements for exciting the strain gauges vary. For example, somestrain gauges operate on a constant voltage and others on a constantcurrent. The name input interface is used to designate the dual functionof power supply for the strain gauges and an AC/DC converter. It will beappreciated that some curemeters contain an AC/DC converter so that theconverter is not necessarily physically contained in the unit designatedat 1 but may simply be connected therewith by appropriate switchingmeans. The input interface unit for use with the aforesaid Wiseinvention of Ser. No. 634,257, wherein the shearing force is sensed at apredetermined time fraction of the strain cycle, will include a sampleand hold amplifier because the predetermined test time will notnecessarily coincide with the sampling time of the Rheometer and thevalue at the preceding sample time will then be used.

An analog-to-digital converter 3 is connected by line 22 to the outputof the force transducer 2 via the input interface unit 1 and indicates,in the case of the Rheometer, the torque required to oscillate therotor. The torque signal, in turn, is a measure of the modulus of thecuring rubber. The BCD digital clock 4 constitutes a preferred timingmeans. The BCD encoded card is placed in a standard card reader 6adapted for use with the type of card selected. Suitable readers forstandard IBM 80 column cards are available from a number ofmanufacturers. The card reader contains two normally closedmicroswitches and unless the card is inserted correctly, the indicatorlight 15 is illuminated. The digital clock 4, which automatically startsat the beginning of a test, uses the line frequency to generate thetiming pulses for which purpose BCD outputs for up to 99.9 mins. areproduced. The clock outputs on line 23 are continuously compared in thetime comparator 5 with the times encoded in the card, as indicated bythe output on line 24. Time comparator 5 produces a command signal online 25 on each occasion a test time is reached. More particularly, whenthe time comparator finds correspondence between the predetermined BCDcoded test time and the BCD coded clock time, the command signalgenerated in the time comparator 5 is directed to a control in thetiming and control logic 7. The timing and control logic 7 generates acommand signal on line 26 to the analogto-digital converter 3 to holdthe test value existing at that time. The digital representation of thetorque on line 27 is directed into the controls of the torque comparator8 and of the multiplexer 9. The specification values, that is, upper andlower specification limits appearing on lines 28 and 29, respectively,of the card reader 6 are also received by the multiplexer 9 and by thetorque comparator 8. The specification values are compared to the actualtest value in the torque comparator 8. Should the actual value beoutside the specification limits, an indicator lamp 13 is illuminated,and the information is stored in a flip-flop which is interrogated afterthe fourth test point and a character is printed in theout-of-specification column on the print-out sheet. The two lines to theflip-flop are represented by 30. The indicator light 13 is run directlyoff the flip-flop and once illuminated, remains lighted throughout allof the test points. However, for recording on the data recorder 12, theinformation is stored.

The digital clock 4 serves the dual function of timing and providingtimed pulses for actuating the multiplexer 9 and the BCD decimalserializer 10. Timed pulses are transferred by line 31 to the timing andcontrol logic 7 where they are gated and distributed. Indicator light 14comes on at the beginning of a test to show that a test is in progress.At each test point the multiplexer 9. is actuated by clock pulses fromthe digital clock 4 routed through the timing logic 7 to the multiplexervia line 32. Line 32 is the path for the pulse sequence used to selectdata from each of the three torque inputs on lines 27, 28 and 29 and iscomposed of three lines, one associated with the lower limit, one withthe higher limit, and one with the measured torque. Only one line canhave voltage at any one time so that only the data associated with oneline can be transferred at one time. The preferred order is lower limit,actual value and higher limit. The multiplexer presents the lowspecification value, the torque reading and the high specification valuein turn to the BCD decimal serializer 10. The latter circuitry acceptsthe parallel BCD data via line 33 and converts it to serialized decimalon output line 34 which is printed or punched out, via the outputinterface unit 11, on a typewriter, teletype terminal, paper tape punchor other similar device 12. The pulse sequence to convert parallel datato serial form is carried by line 35 which is composed of four linesbecause there are four decimal digits. Both the serializer 10 andmultiplexer 9 are standard items of commerce and require no detailedexplanation.

The apparatus described accommodates times up to 99.9 minutes andparameter values up to 199.9. Thus, the clock output on line 23 to thetime comparator 5 requires 4 BCD lines representing 1, 2, 4 and 8,respectively, for each of the three decimal digits or a total of 12. Thedigital representation of torque on line 27 requires 13 lines, the extraline being necessary to provide for the l of the hundreds digit to reach199.9. Simple additions to the circuitry would provide for longer timesand higher parameter values.

The time value on the card to be tested for coincidence with the digitalclock time is carried by line 24 for which purpose 12 lines again mustbe supplied. Time coincidence generates a command signal on line 25 forwhich only one line is needed to the timingand control logic 7 whichthen generates another command signal on line 26 to analog-to-digitalconverter 3. However, the first function of timing and control logic 7is to provide at the commencement of the test six pulses which aresequentially dispatched via line 36 to the card reader 6. These sixpulses in turn activate each of the six columns allocated on the cardfor identification purposes. The identification information coded in BCD10 lines to represent each of the figures -9. Output interface unit 11is essentially an amplifier. The serialized decimal output on line 34 isat low voltage and the power must be amplified to that required tooperate the data recorder. In the case of a typewriter, a solenoid isunder each key 0-9 and power sufficient to operate the solenoids isrequired. Each of the ten lines constituting line 34 terminates at asmall amplifier. The amplified signals are carried by line 38 to thesolenoids. The amplified signals are carried by 14 lines, of which havebeen previously identified. Four additional lines are required forspace, period, carriage return and out-oflimits signal whichconveniently may be a question mark. The aforesaid four lines arecarried to the output interface unit via line 39.

is routed directly via line 37 into the BCD to decimal converter portionof BCD decimal serializer l0 and is immediately printed out. Thetransfer of compound identification requires four lines. If no holeshave been punched on the card in the six columns allocated for compoundidentification, then six zeros will be printed out.

The serialized decimal output on line 34 comprises Eleven columns areallocated to each of four test Step Activity l. A pulse is dispatchedvia line 39 to the output interface unit 11 to activate the space key onthe typewriter 12.

II. A voltage is applied to the lower set point (LSP) line 29 on themultiplexer 9. This causes the LSP to appear in BCD at the input to theBCD decimal serializer 10.

III. If the LSP number presented to the serializer is say 123.9, thenthree pulses are routed sequentially to the BCD decimal serializer vialine 33 and the numbers 1, 2 and 3 are printed out. At line 33 13 linesare required to handle numbers up to 199.9. A pulse is then dispatchedvia line 39 to the output interface unit 11 to activate the period keyon the typewriter 12. Finally, a pulse is again routed into theserializer via line 3 3 to cause a printout of the number 9. If thefirst number is V. Step III is now repeated. Simultaneously, however,the set point comparator 8 is interrogated for specification violations;a flip-flop in timing and control logic 7 is toggled if a violationoccurs and the indicator light 13 is illuminated. This flip-flop isitself interrogated at the end of the test in Step X.

VI. The voltage applied to line 27 is now transferred to the Upper SetPoint (USP) line 28. This causes the USP to appear in BCD at the inputto the BCD decimal serializer 10.

VII. Step III is now repeated.

VIII. The information relating to the first test point has now beenprinted. The voltage applied to the eleven columns related to the firsttest point. is transferred to the next l1 columns which hold the secondtest point information.

IX. Three more time coincidence signals will be received by the timingand control logic 7 and on each occasion the same procedure, that is,Steps I through VII will be repeated. The positions referred to in StepVIIl will be updated by one position on each occasion except that at theend of the fourth test point the voltage will go back to the elevencolumns associated with the first test point, that is, ready to startagain.

X. Upon completion of the printout of the fourth test point, theflip-flop mentioned is Step V is interrogated. Ifit has been toggled, itwill permit a pulse to be routed to the space key on the typewriter andthen a second pulse to be routed to the question mark key on thetypewriter. The flip-flop is then reset to its normal position. If theflip-flop had not been toggled, Step XI would be executed immediately.

XI. A pulse is routed to the carriage retum-line feed key on thetypewriter.

XII. Finally, a voltage is applied to the clock reset line This returnsthe clock counting circuit to zero and holds it there until the start ofthe next test.

In its preferred form, the record provided by the system of FIG. 2produces an output format which lends itself to statistical studies ofthe four test points. Each complete test occupies exactly one row andthe actual test values of each test are listed vertically one above theotherwhich permits direct observation of reproducibility. The preferredformat is shown by the following table where, under each test, thenumbers represent lower specification limits, actual value and highspecification limits, respectively.

Off

Com-

pound lst test 2nd test 3rd test 4th test spec.

120468.-.. I2. 6 11.7 16.6 27.0 32. 4 33. 0 59.1 51. 6 65.1 76.0 65. 280. 0 120468. 12. 6 11. 7 16. 6 27. 0 32. 9 33. 0 59. l 47. 8 65. 1 76.0 60. 1 80.0 120468.. 12. 6 13. 0 16. 6 27. 0 31. 4 33.0 59. 1 60. 1 65.1 76.0 77.0 80. 0. 120468... 12. 6 11.6 16. 6 27. 0 31. 4 33.0 59. 1 47.1 65. 1 76. 0 60. 9 80. 0 'I 120468.... 12.6 11. 9 16. 6 27.0 31. 9 33.0 59. 1 47. 3 65. 1 76. 0 60. 7 80. 0 120468... l2. 6 11. 9 16.6 27.031. 6 33.0 59. l 47. 4 65. 1 76.0 60. J 80. 0 '2 zero, the signal issuppressed and the space key is activated instead of printing zero.

IV. The voltage applied to the LSP is now transferred to line 26. Thiscauses the BCD representation of torque provided by theanalog-to-digital converter 3 to appear at the input to the BCD decimalserializer.

There is at present no accepted method of applying specification limitsto a rheometer curve. The two basic types of gates possible are torquegates and time gates.

Torque gates operate at a predetermined time and compare rheometertorque values against prespecified upper and lower torque limits. Thesegates are essential for minimum torque (viscosity) and maximum torquevalues. However, they are not entirely satisfactory on the fast risingportion of the rheometer curve.

Time gates operate at a predetermined torque value and compare the timeactually taken to reach this torque value against prespecified minimumand maximum times. These gates are best suited to operate on the risingportion of a fast curing rubber stock.

Examples of these two, that is, torque and time gates,

was between m and m if no specification violation occurs using thesystem of FIG. 2.

The system of FIG. 2 will be fully understood by those skilled in theart from the foregoing explanation and the following table which relatesthe blocks and functions of FIG. 2 to components. The integrated circuittype is given. DM identifies the National Semiconductor Co., SN theTexas Instrument Co., and MC the are shown on the accompanyingrheograph, FIG. 3. M l C Integrated Block of circuit Qua|1- Fig. 2Function of block type tity Component 5. v. To generate a coincidencesignal im- DMSZOON -l 4-bit comparators.

incdiatcly, the time for a test point as encoded on the card equals thetime generated by the clock.

i h. To generate real elapsed time indiea- SN74ION ti Decade counters.

tion and provide timing pulses to MC853I 1 Dual J K flip-flop. thecontrol circuitry for printout MCBOOOL 1 Quad 2i/p NAND gate. purposes.MC3003L 1 Quad .Zi/p O R gate.

6 To read data punched in 1301) form MC30l0L Dual -li/p NAND gates.

onastandard 80eclumneard reader. MC300lL 1 Quad 2i/p AND gates.

MC30l5L 4 8 i/p NAND gate.

1 "AMP card reader type 2980 A.

3 Toeonvert analog signals in the -200 Digital panel meter, United mV DCrange into BCD form. Systems Corp., Model 271-1N.

7 To accept timing pulses from 4 and SN7-1I111N 3 Triple 3i/p AND gate.

coincidence signals from to dis- SN7476N 3 Dual J-K fiipfiop. tributelogic pulses through the M08361 3 Hex inverter. desired operation andoutput. M08461 3 Quad Bi/p NAND gate.

- M08521 1 Dual J-K fiip-flop. MC853I 1 Dual J-K flip'flop. MC3001L 3Quad 2i/p AND gate. MCSOOBL 2 Quad ll/p OR gate. MC3005L 2 Triple 3i/pNAND gate. MC3025L .5 Dual ii/p NANl) power gate. MC3026I, .5 Dual 4i/pANl) power gate.

1| 'lo sequentially present at its output SN74H52N l3 Quail 2i AND-r itut the lower specification limit, the torrpievalueand the upperspecification limlt on command.

8 To compare the torque (MBCD) DMBZOON 8 4-bit comparators.

against the specification limits encoded on the card and provide an outof specification signal when necessary.

10 To convert to a serialized decimal out- SN74H11N 1 Triple 3i/p ANDgate.

put the parallel BCD input. SN74H52N 4 Quad 2i/p AND-OR gate. SN7442N 1BOD-decimal converters. M08341 2 Hex. inverters. MC300lL 1 Quad 2i/p ANDgate. MC3003L 1 Quad 2i/p OR gate.

FIG. 3 shows torque gates q,, and q and time gates m and m The torquegates at time m, represent the lower specification limit (1 and thehigher specification limit q at a point on the curve where the slope isslight. The torque q at time m is within the acceptable limits. Timegates are shown on the steep part of the curve. A predetermined torque qis selected and time m designates the minimum and time m designates themaximum time acceptable for reaching q However, it is possible to form atime gate from two torque gates as shown in FIG. 4. The higherspecification limit of one test point is made equal to the lowerspecification limit of the next test point, thereby providing equaltorque gates separated by time. Referring to FIG. 4, the first testpoint, at time m is examined as before but the lower specificationvalue, q',, for the second test point at time m is set at zero, and thelower specification value (1",, at the third test time m is set equal toq' the higher specification value at time m The upper specificationlimit at time m is set at some high figure, for example, 99.9. Times mand m are the selected lower and upper specification limits for thetorque to reach q',, q", and although the actual time m is not measured,it will be known that m,

by FIG. 5. Blocks 1-15 remain as in FIG. 2, but com-- ponents 16-19 areadded.

Integrated circuit type Block of Qnan- Fig. 5

Function of block tity Component l6. To generate a co- DM82OON incidencesignal immediately the torque for a test point as encoded on the card isequal to or greater than the torque value indicated by theanalog-to-digital converter.

17. To sequentially pre- SN74II52N 13 Quad 2i/p AND- sent at its outputOR gates. the lower time limit. the true time and the upper time limiton command.

lb To compare elapsed time against specification limits encoded on thecard and provide an out of specification signal when necessary.

ln To relay to the output of either 7 or J.

4 4-bit comparator.

DMSZZOON X H nit com parator.

'1NG7254 7 Dual 21/1) AND- 0 it gates.

It will be noted that three of the four additions comprise duplicates ofblocks already present, thus 16, i7 and 18 are the same as 5, 9 and 8,respectively. The operation of the system simply entails extension ofthe principles already discussed. The torque value on the card istransmitted by line 41 comprising 13 lines to torque comparator l6 andthe torque coincidence signal transmitted via line 41 to the timinglogic and controls 7 for which purpose only a single line is needed.Transfer lines 43 and 44 of 12 lines each serve to get the minimum andmaximum limits from the card reader into the multiplexer and into thespecification limit comparator. The digital representation of elapsedtime to be compared with the minimum and maximum time limits istransmitted by line 45. Line 46 is the path for pulse sequence used toselect data from each of the three time inputs 43, 44 and 45. As before,line 33 is the path of torque data in parallel BCD form data but is fedto a two-way multiplexer 19 instead of directly to the serializer 10,and line 47 is the path of time data in parallel BCD form. The parallelBCD dataselected in 19 travels via line 48 to the serializer 10. Theoutput on line 49 controls whether the two-way multiplexer selectstorque or time for which purpose two lines are required. In FIG. 5, anextra line 50 is needed besides the lines of line 36 to inform thetiming and control logic 7 whether torque or time coincidence is sought.The particular type of coincidence, that is, time or torque, is coded onthe card for each test point. The timing and control logic circuitryuses this information to control the multiplexer.

If time is out'of limits, the flip-flop is activated by line 51 composedof two lines to dual set point comparator 18.

Although the primary purpose of this invention is to provide a recorderand indicator for production control use in the rubber industry, anysystem which has a parameter that varies with time could, through asuitable sensor/transducer, be coupled to the instrument of thisinvention. Gas chromatography and various forms of spectroscopy fallinto this category. The examples of the invention disclosed herein werechosen merely to illustrate typical embodiments of the invention, and itwill be appreciated that the invention is not limited thereto.

Furthermore, it will be apparent that the embodiments shown are onlyexemplary and that various modifications can be made in construction andarrangement within the scope of the invention as defined in the appendedclaims.

We claim:

1. Method of applying predetermined specification limits, selected on arheometer cure curve of a vulcanizable elastomer, to rheometer test datareceived in the form of an electrical analog signal of torquecomprising:

reading electronically a coded record of specification limits at two ormore predetermined test points on the, cure curve selected from a pointin the vicinity of minimum torque, a point in the vicinity of maximumtorque and a point at an intermediate point on the steep part of thecure curve and generating digital signals representative of said limits,

generating timing signals and a command signal to initiate comparison ofthe specification limits with test values at the predetermined testpoints,

selectively measuring torque at the predetermined times or measuringtimes to reach predetermined torques,

converting the analog test signals to digital signals,

electronically comparing the test values to the specification values,

mechanically recording the specification limits and actual test values.

2. Testing apparatus for indicating departure from predeterminedspecification limits and for recording said limits and actual testvalues at each test point over a selected range over which range aparameter varies with time, the value of the parameter being received inthe form of an electrical analog signal, the predetermined specificationlimits and test points appearing in coded form on a coded record,comprising:

a. record sensing means for reading the coded record of thespecification limits at predetermined test points and supplying digitalsignals representative of the specification limits and test pointvalues, said test point values corresponding to predeter mined timesover'said range and predetermined. values of the parameter,

b. converting means for converting said analog signal to a digitalsignal, which provides a digital measure of said parameter,

0. means for generating signals representing the time over which theparameter varies,

d. first compare means for comparing the value of the parameter receivedfrom said converting means at'predetermined times with the specificationlimits received from said record sensing means at said times and secondcompare means for comparing the times to reach predetermined values ofthe parameter received with the specification limits at saidpredetermined parametervalues, said first and second compare meansincluding means for indicating when a test value is outside thespecification limits,

e. first command means responsive both to said digital signalsrepresentative of said test point values and to signals representativeof the time over which the parameter varies for producing first commandsignals, and second command means responsive both to said digitalsignals representative of said test point values, and to signalsrepresentative of the value of the parameter for producing secondcommand signals,

f. control means, responsive to said first and second command means,said first and second compare means and said record sensing means forgenerating digital timing signals and g. recording means, responsive tosaid record sensing means, said converting means and said control meansfor serially recording the specification limits and the actual testvalue of the parameter in decimal form. I

3. The testing apparatus as recited in claim 2 wherein said recordsensing means further generates an identification signal and saidrecording means records said identification signal and is responsive tosaid first and second compare means for recording whether a test valueis outside the specification limits.

4. The testing apparatus as recited in claim 3 further comprising atorque measuring means.

5. The testing apparatus as recited in claim 2 further comprising aviscosity sensor which senses the changes in viscosity of a soliddeformable substance during the test and wherein the torque is a measureof the viscosity, said sensor producing said electrical analog signalwhich is proportional to torque. v

6. The testing apparatus as recited in claim 5 wherein said recordsensing means and said converter means include means for generatingbinary coded decimal signals.

7. The testing apparatus as recited in claim 2 wherein said recordsensing means is a card reader.

8. The testing apparatus as recited in claim 7 wherein said means forgenerating a command signal comprises:

a. time comparing means responsive to said timing signals and saidrecord sensing means for generating a command signal when the timingsignals correspond to a predetermined time, and

b. parameter comparing means-responsive to said time varying parameterand said record sensing means for generating a command signal when thevalue of the time varying parameter corresponds to a predeterminedparameter value.

9. The testing apparatus as recited in claim 8 wherein said recordingmeans comprises:

a. multiplexing means responsive to said control means, said recordsensing means and said converter means for sequentially presenting atits output the lower specification limit, the measured value of theparameter and the upper specification limit,

. serializer means responsive to the output of said multiplexer meansand controlled by said control means for providing a serialized decimaloutput, and

. a typewriter receiving said serialized decimal output and typing outsaid lower specification limit, said measured value and said upperspecification limit.

10. Testing apparatus for indicating departure of the value of ameasured time varying parameter from predetermined limits and forrecording the limits and the actual measured test values of theparameter at each test point over a range in which the parameter vatieswith time comprising:

means for receiving an analog signal representative of the value of theparameter,

converting means for converting said analog signal to a digital signal,means for generating signals representing the time over which theparameter varies, record sensing means for reading a coded record of thepredetermined limits and test point values and for supplying digitalsignals representative of the predetermined limits and test pointvalues, said test point values corresponding to predetermined times oversaid range, means, responsive to said test point values and signalsrepresenting time over which the parameter varies for generating commandsignals,

compare means, responsive to said command signals, for comparing thedigital signal representing the value of the parameter with saidpredetermined limits at predetermined times, and

recording means responsive to said record sensing means and saidconverting means for serially recording the predetermined limits and theactual value of the parameter at the predetermined times in decimalform.

11. Testing apparatus as recited in claim 10 further including indicatormeans responsive to said compare means for producing a signal indicatingthat the value of the parameter is outside said predetermined limits.

12. Testing apparatus for indicating departure from predetermined timelimits at test points over a selected range over which a parametervaries with time said limits and test points being stored on a codedrecord comprising:

means for-receiving an analog signal representative of the value of thetime varying parameter,

converting means for generating a digital signal representative of thevalue of said parameter,

means for generating signals representing the time over which theparameter varies,

record sensing means for reading a coded record of the predeterminedlimits and said test points and for supplying digital signalsrepresentative of the predetermined limits and the test points, saidpredetermined limits corresponding to time limits for the parameter toreach predetermined values, said test points being said predeterminedparameter values,

means responsive to said digital signal representing said predeterminedparameter value and to said digital signal representative of the valueof a time varying parameter for. generating a command signal, and

compare means, responsive to said command signal,

for comparing the predetermined time limits with the time signalsgenerated by said time signal generating means, said compare meansincluding means for indicating departures from said predeterminedlimits.

13. Testing apparatus as recited in claim 12 further including recordingmeans responsive to said record sensing means and said converting meansfor serially recording predetermined time limits and the time generatedby said time signal generating means at the test points in decimal form.

* i ll! l

1. Method of applying predetermined specification limits, selected on a rheometer cure curve of a vulcanizable elastomer, to rheometer test data received in the form of an electrical analog signal of torque comprising: reading electronically a coded record of specification limits at two or more predetermined test points on the cure curve selected from a point in the vicinity of minimum torque, a point in the vicinity of maximum torque and a point at an intermediate point on the steep part of the cure curve and generating digital signals representative of said limits, generating timing signals and a command signal to initiate comparison of the specification limits with test values at the predetermined test points, selectively measuring torque at the predetermined times or measuring times to reach predetermined torques, converting the analog test signals to digital signals, electronically comparing the test values to the specification values, mechanically recording the specification limits and actual test values.
 2. Testing apparatus for indicating departure from predetermined specification limits and for recording said limits and actual test values at each test point over a selected range over which range a parameter varies with time, the value of the parameter being received in the form of an electrical analog signal, the predetermined specification limits and test points appearing in coded form on a coded record, comprising: a. record sensing means for reading the coded record of the specification limits at predetermined test points and supplying digital signals representative of the specification limits and test point values, said test point values corresponding to predetermined times over said range and predetermined values of the parameter, b. converting means for converting said analog signal to a digital signal, which provides a digital measure of said parameter, c. means for generating signals representing the time over which the parameter varies, d. first compare means for comparing the value of the parameter received from said converting means at predetermined times with the specification limits received from said record sensing means at said times and second compare means for comparing the times to reach predetermined values of the parameter received with the specification limits at said predetermined parameter values, said first and second compare means including means for indicating when a test value is outside the specification limits, e. first command means responsive both to said digital signals representative of said test point values and to signals representative of the time over which the parameter varies for producing first command signals, and second command means responsive both to said digital signals representative of said test point values, and to signals representative of the value of the parameter for producing second command signals, f. control means, responsive to said first and second command means, said first and second compare means and said record sensing means for generating digital timing signals and g. recording means, responsive to said record sensing means, said converting means and said control means for serially recording the specification limits and the actual test value of the parameter in decimal form.
 3. The testing apparatus as recited in claim 2 wherein said record sensing means further generates an identification signal and said recording means records said identification signal and is responsive to said first and second compare means for recording whether a test value is outside the specification limits.
 4. The testing apparatus as recited in claim 3 further comprising a torque measuring means.
 5. The testing apparatus as recited in claim 2 further comprising a viscosity sensor which senses the changes in viscosity of a solid deformable substance during the test and wherein the torque is a measure of the viscosity, said sensor producing said electrical analog signal which is proportional to torque.
 6. The testing apparatus as recited in claim 5 wherein said record sensing means and said converter means include means for generating binary coded decimal signals.
 7. The testing apparatus as recited in claim 2 wherein said record sensing means is a card reader.
 8. The testing apparatus as recited in claim 7 wherein said means for generating a command signal comprises: a. time comparing means responsive to said timing signals and said record sensing means for generating a command signal when the timing signals correspond to a predetermined time, and b. parameter comparing means responsive to said time varying parameter and said record sensing means for generating a command signal when the value of the time varying parameter corresponds to a predetermined parameter value.
 9. The testing apparatus as recited in claim 8 wherein said recording means comprises: a. multiplexing means responsive to said control means, said record sensing means and said converter means for sequentially presenting at its output the lower specification limit, the measured value of the parameter and the upper specification limit, b. serializer means responsive to the output of said multiplexer means and controlled by said control means for providing a serialized decimal output, and c. a typewriter receiving said serialized decimal output and typing out said lower specificatiOn limit, said measured value and said upper specification limit.
 10. Testing apparatus for indicating departure of the value of a measured time varying parameter from predetermined limits and for recording the limits and the actual measured test values of the parameter at each test point over a range in which the parameter varies with time comprising: means for receiving an analog signal representative of the value of the parameter, converting means for converting said analog signal to a digital signal, means for generating signals representing the time over which the parameter varies, record sensing means for reading a coded record of the predetermined limits and test point values and for supplying digital signals representative of the predetermined limits and test point values, said test point values corresponding to predetermined times over said range, means, responsive to said test point values and signals representing time over which the parameter varies for generating command signals, compare means, responsive to said command signals, for comparing the digital signal representing the value of the parameter with said predetermined limits at predetermined times, and recording means responsive to said record sensing means and said converting means for serially recording the predetermined limits and the actual value of the parameter at the predetermined times in decimal form.
 11. Testing apparatus as recited in claim 10 further including indicator means responsive to said compare means for producing a signal indicating that the value of the parameter is outside said predetermined limits.
 12. Testing apparatus for indicating departure from predetermined time limits at test points over a selected range over which a parameter varies with time said limits and test points being stored on a coded record comprising: means for receiving an analog signal representative of the value of the time varying parameter, converting means for generating a digital signal representative of the value of said parameter, means for generating signals representing the time over which the parameter varies, record sensing means for reading a coded record of the predetermined limits and said test points and for supplying digital signals representative of the predetermined limits and the test points, said predetermined limits corresponding to time limits for the parameter to reach predetermined values, said test points being said predetermined parameter values, means responsive to said digital signal representing said predetermined parameter value and to said digital signal representative of the value of a time varying parameter for generating a command signal, and compare means, responsive to said command signal, for comparing the predetermined time limits with the time signals generated by said time signal generating means, said compare means including means for indicating departures from said predetermined limits.
 13. Testing apparatus as recited in claim 12 further including recording means responsive to said record sensing means and said converting means for serially recording predetermined time limits and the time generated by said time signal generating means at the test points in decimal form. 